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Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations : Equipment and Operations Automation in the Semiconductor IndustryBLUE, Jakey; CHEN, Argon.IEEE transactions on automation science and engineering. 2011, Vol 8, Num 1, pp 56-66, issn 1545-5955, 11 p.Article

Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deteriorationCHEN, Argon; WU, G. S.International journal of production research. 2007, Vol 45, Num 15, pp 3351-3379, issn 0020-7543, 29 p.Article

Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planningCHEN, Argon; HSU, C.-H; BLUE, J et al.International journal of production research. 2007, Vol 45, Num 10, pp 2269-2294, issn 0020-7543, 26 p.Article

Weighted least-square estimation of demand product mix and its applications to semiconductor demandCHEN, Argon; YANG, Kyle; HSIA, Ziv et al.International journal of production research. 2008, Vol 46, Num 16, pp 4445-4462, issn 0020-7543, 18 p.Article

COMPUTERIZED DETECTION AND QUANTIFICATION OF MICROCALCIFICATIONS IN THYROID NODULESCHEN, Kuen-Yuan; CHEN, Chiung-Nien; WU, Ming-Hsun et al.Ultrasound in medicine & biology. 2011, Vol 37, Num 6, pp 870-878, issn 0301-5629, 9 p.Article